Cal Lab Posts First Article in Spanish:
La Metrología y Su Impacto en las Universidades Tecnológicas, México

The first ever Cal Lab article in Spanish is available for download on the Cal Lab website. The Jan-Mar 2009 issue of Cal Lab included an article by Sergio Martínez-Sánchez, Fabiola M.C. Laguna-Aguilar and Jorge C. Torres-Guzmán discussing the progress Mexico has made in incorporating metrology studies in the Universidad Tecnologica at Tula Tepji and its impact on the manufacturing sector. Martínez-Sánchez and Laguna-Aguilar are graduates of the program now teaching at the university and Torres-Guzmán works at the Centro Nacional de Metrología (CENAM), Mexico's NMI.

The article "Metrology Impact in Technological Universities, Mexico" is available in the Jan-Mar 2009 issue (Download here). En Español: "La Metrología y Su Impacto en las Universidades Tecnológicas, México." (Aquí)

We are looking for volunteers to help translate future articles into Spanish. Please email us at office@callabmag.com if you can assist.

COMING UP ...

CONFERENCES 2010

Feb 28 - Mar 5 Pittcon 2010 Conference on Analytical Chemistry and Applied Spectroscopy. Orlando, FL. Pittcon 2010 will again offer the latest advances in laboratory instrumentation, supplies and services; comprehensive solutions for research problems; new methodologies and techniques for improved productivity; and a wide range of educational opportunities. www.pittcon.org.

Mar 22-26 Measurement Science Conference. Pasadena, CA. The theme for the 2010 conference is Global Measurement: Economy & Technology. www.msc-conf.com/msc/index.html.

Apr 14-16 International Scientific Conference Coordinate Measuring Technique. Bielsko-Biala, Poland. The aim of the conference is exchange of information on scientific and technological advances in the field of coordinate measuring machines design, software, measurement practice and coordinate measuring machines performance and last but not least the influence of coordinate measuring technique on geometrical product specification. Conference subjects include: Coordinate measuring machines; Theory of coordinate measuring technique; Traceability and CMM inspection; Coordinate measurement in practice; Education in coordinate metrology; Form, orientation, location and run-out measurements; Gears measurements; Geometrical product specification (GPS); Unconventional 3D measurements; Measuring systems and monitoring of machine tools; Surface roughness 3D measurements. www.wtp.pl.

Apr 19-23 Third International Metrology Conference CAFMET 2010. Cairo, Egypt. You have the opportunity to present your research results, your experience and your products in connection with the following topics: Regional Metrology Organizations; Accreditation/Certification; Standards and Quality; Legal Metrology; Fields of scientific and industrial activities (temperature, volume, mass...); Metrology in health, food safety and environment; Measurement Uncertainties; Statistical Process Control and Optimization; Applied Statistics for Measurement; Reliability and Products Conformity; Methods validation, Interlaboratory Comparisons. Your abstract and papers can be proposed either in English or French. The selection is done by a scientific and technical committee of professors and professionals. African Committee of Metrology / Le Comité Africain de Métrologie (CAFMET), www.ac-metrology.com. CAFMET2010 (pdf)

May 3-6 IEST 56th Annual Technical Meeting and Exposition. Reno, NV. www.iest.org

Mar 31 - Jun 4 TEMPMEKO & ISHM. Portoroz, Slovenia. The International Symposium on Humidity and Moisture (ISHM), and the International Symposium on Temperature and Thermal Measurements in Industry and Science (TEMPMEKO) are the premier international meetings for measurement science and standards, in their respective fields. Recognising the coinciding schedule and strong synergy between the two events, the 6 ISHM and 11 TEMPMEKO will take place together in 2010 as a joint event, coordinated by the responsible committees, CIPM CCT/WG6 and IMEKO/TC12. www.tempmeko-ishm.org.

FOR MORE INFORMATION ON THESE CONFERENCES AND MORE CALENDAR LISTINGS -- INCLUDING SEMINARS CLICK HERE!!

3rd edition of the International Vocabulary of Metrology (VIM3) Available from BIPM

The BIPM has announced the publication of the 3rd edition of the International Vocabulary of Metrology (VIM3), and Supplement 1 to the GUM (Guide to the Expression of Uncertainty in Measurement), avialable for download on its website. www.bipm.org/en/publications/guides/

New Website for French Metrology

A new website at www.metrologiefrancaise.fr offers convenient links to metrology news, events and international metrology organizations all in French. The site provides information on measurement history, units of measurement and national measurement references used, and provides information on current French metrology research projects. Other sections include bibliography for the field of measurement, a glossary of terms used in metrology and various links to French organizations active in the field of metrology. A bookstore section allows visitors to search for and order French metrology publications (French Metrology Review, BNM Bulletins, monographs).

UKAS Electrical & Temperature Day
December 8

Once again NPL (Teddington, UK) is delighted to be hosting the biennial UKAS Electrical & Temperature Day. This day will appeal to everyone interested in technical aspects of electrical and temperature measurement and the role of accreditation in laboratories. This is a chance to visit The National Physical Laboratory, tour some of their laboratories, hear talks on temperature and electr ical measurement accreditation topics and to meet UKAS staff. The Accreditation Manager and many of the EPT UKAS Assessment Managers will be in attendance to meet potential and existing accreditedlaboratories and technical assessors. Confidential "Surgery" style sessions are bookable.

Contact: electricalandtemperatureday@ukas.com or phone 020 8917 8559

www.npl.co.uk/events/8-dec-09-ukas-electrical-and-temperature-day.

NAPT ILC/PT Regional Events Planned for Early Fall!

Maintaining Accreditation status is of the utmost importance in these economic times. It reflects the strength of your business along with dedication to customers by providing quality calibration services. NAPT appreciates the metrology communities desire to provide a quality product by participation in ILC/PTs. We understand the need is present for participation in particular proficiency tests that can only be conducted through Regional Events. Therefore, NAPT is partnering with host facilities to provide the opportunity to participate in 6 specific ILC/PTs: Analytical Balance, Bench Scale, Optical Comparator, Surface Plate, Hardness Test, and Calibration of a CMM.
Plans are in the works to conduct Regional Events in the following areas: Flint, MI, Schaumberg, IL, Danville, VA, Louisville, KY. Other locations are quite possible if the response we receive warrants it.
We look forward to assisting new and established participants with meeting your accreditation requirements. The concentrated efforts of our staff, Board of Directors, Technical Advisors, and Reference Labs all contribute to NAPT remaining the leader as a proficiency test provider.
We invite you to contact us to register for the above events or with any questions or comments.
NAPT, 901 Twelve Oaks Center Drive, Suite 920, Wayzata, MN 55391, Tel 952-303-6126, fax 305-425-5728, napt@proficiency.org, www.proficiency.org

NAPT's Stimulus Package

NAPT's new Stimulus Package is being very well received and has provided a significant savings to our members. The Stimulus Package is being offered through 2009. Current NAPT members can take advantage of the savings upon membership renewal. If you are not currently a member and would like to learn more about this savings opportunity, please contact the NAPT offices at 952-303-6126.

CEMMNT’s new website provides a comprehensive guide to metrology for industry

The Centre of Excellence in Metrology for Micro and Nano Technologies (CEMMNT) has launched a new website www.cemmnt.co.uk providing comprehensive information for industry on metrology, surface analysis and systems engineering. The site includes details on cutting edge measurement and characterisation techniques. Over 30 case study applications underline the practical benefits of measurement and characterisation at the micro and nanoscale. Examples from design, development, quality control and failure analysis underline the importance throughout the product development process and supply chain. Web pages focusing on different industry sectors collate the key techniques and relevant applications that are commonly applied to accelerate product commercialisation.

The site also provides details of conferences, workshops and exhibitions for the community. With new information being added weekly, the site provides a valuable portal for industry.

UK National Measurement System Launches Chemical and Biological Metrology website

The new NMS website www.nmschembio.org.uk contains a wide range of information and material which will help laboratories ensure the quality, reliability and comparability of measurements.

• Highlights:
• Comprehensive publications database with papers, books, reports, guides
• Information on key topics such as mass spectrometry, method validation and measurement uncertainty
• Training and education resources for schools, universities and laboratories
• Events listing of relevant training courses and conferences worldwide
• Access to help and expert advice on measurement topics
• Projects section detailing work being carried out under the NMS Chemical and Biological Metrology programme

Register using the link below to gain access to new free downloadable material such as the Laboratory Skills Training Handbook and the Best Practice Guide for Generating Mass Spectra.

http://www.nmschembio.org.uk/Register.aspx?m=79

Agilent Launches Quarterly Publication

Agilent Technologies Inc. has announced the launch of its new quarterly technical publication, the Agilent Measurement Journal, which is specifically tailored to the needs of technology leaders in the electronic measurement industry. The 80-page inaugural edition has been sent to more than 50,000 customers worldwide.

The Agilent Measurement Journal will cover a wide range of industries, including aerospace and defense, wireless communications and industrial, and feature articles with significant contributions from Agilent engineers in the fields of electronics as well as life sciences and chemical analysis. It is available to Agilent customers as a print publication or in electronic format at www.agilent.com/go/journal