Gas flow rate measurement devices are usually calibrated in secondary flow laboratories and the lower level measurement standards are conducted to the traceability chain by the primary or national measurement standards which are established and […]
By Roman Honig We can observe an increased interest in high resistance measurements in the range of MΩ to TΩ. This may be related to recent inter-laboratory comparisons in this area, or to increasing activities […]
Wafer-to-wafer bonding has become an enabling semiconductor technology in industries such as 3D packaging, MEMS, MOEMS, and SOI. In a typical wafer bonding process, two flat substrates are permanently joined (bonded) to one another by […]
The calibration of universal testing machines using calibrated force transducers (load cells) is very important for industry and research institutions in any country in the world. Some factors may affect the calibration results considerably. This […]
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