Fluke Application Notes – Temperature

November 29, 2011 Office

Download Fluke Calibration’s application note, Temperature Measurement and Calibration: What Every Instrument Technician Should Know, which will help you chart your course to understanding temperature sensor types, traceability, accuracy and the equipment required to calibrate […]

Redefining the SI Base Units

November 22, 2011 Office

Metrology is poised to undergo a profound change that will benefit scientists, engineers, industry and commerce – but which almost no one will notice in daily life.  The international General Conference on Weights and Measures […]

Gigahertz-Optik X1-RM Multimeter

November 18, 2011 Office

Gigahertz-Optik’s X1-RM Multimeter is a rack-mountable version of the X1 series hand-held universal optometer for use with a wide variety of detector types. It combines a powerful microprocessor and electronics in a rack-mountable module for […]

An Introduction to Mass Metrology in Vacuum

November 16, 2011 Office

By Patrick J. Abbott & Zeina J. Jabbour Mass metrology carried out in atmospheric pressure air is suitable for most every critical application. However, mass metrology in vacuum is important in several current research projects. […]

nVision Produces Tamper Proof Digital Records

November 15, 2011 Office

A new update for the nVision Reference Recorder by Crystal Engineering – an Intrinsically Safe, modular device for recording pressure and temperature – focuses on data integrity and user safety. Now, users wanting tamper proof […]