Pieces Parts
by Dan Wiswell About thirty years ago I was doing some spring cleaning and decided to bring a few tables worth of items to a large flea market in south-central New Hampshire. I had an […]
Year: 2022
The Need for Model-Driven Metrology Software Engineering
I am going to try and take a huge concept in software engineering and design, break it down into its core functions, then show how it applies to metrology software in less than 850 words. […]
Photon momentum for metrology – PTB.de
The optical cavity consists of two ultra-high-reflectivity mirrors (reflectivity > 99.995 %) that are suspended from two electromagnetic force-compensation balances. The visible laser beam is reflected 21 times between the mirrors. Source: Photon momentum for […]
Keysight Delivers High Performance Vector Signal Generator
SANTA ROSA, Calif. April 26, 2022 Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that delivers advanced design and validation solutions to help accelerate innovation to connect and secure the world, today launched a […]
2nd Edition Released for Measurement Uncertainty: A Reintroduction
A much enlarged second edition of Measurement Uncertainty: A Reintroduction, by Antonio Possolo (NIST) and Juris Meija (NRC Canada) was released April 6, 2022. An inter-American collaboration, the publisher is Sistema Interamericano de Metrologia (SIM) […]
Yokogawa AQ6380 awarded highest class score by 2022 Lightwave Innovation Reviews
February 9, 2022 – Yokogawa Test&Measurement, a pioneer and leader in precision optical measurement, is pleased to announce that the latest addition to its optical spectrum analyzer line, the AQ6380 Highest Performance OSA has received […]
New Rohde & Schwarz LCX LCR Meter
With a completely new family of high performance LCR meters, the frequency range of impedance measurements provided by Rohde & Schwarz test equipment is dramatically extended to cover AC components operating from 4 Hz to […]
A material measure for optical surface measurement – PTB.de
PTnews 1.2022 – The measurement responses of optical measuring devices to surface topography can be described by the instrument transfer function (ITF). At PTB, a novel material measure has been developed to characterize two-dimensional instrument […]