by Matthew Gingerell and John A. Jacanin Volume 7:4, Jul-Aug 2000 “Certified” low-conductivity solutions down to 10 microsiemens/cm are readily available for the calibration of conductivity/resistivity instrumentation. Can these standards be relied upon for accurate […]
by David Mendoza Volume 16:4, Oct-Dec 2009 The errors associated with the calibration of broad band UV meters based on the light source used during calibration are well documented but appear to not be very […]
by John Hurll Volume 16:4, Oct-Dec 2009 It is often the case that it will be necessary to provide information in calibration reports about whether or not the stated results for general purpose test and […]
by Richard Fertell Volume 16:3, Jul-Sep 2009 The Meter Convention (Convention du Mètre) is a treaty signed in 1875 that created the International Bureau of Weights and Measures (BIPM), an international organization under the authority […]
by Nicholas Kollerstrom Volume 12:4, Oct-Dec 2005 “Was the Earth measured in remote antiquity?” This was the stirring question with which Berriman opened his book, Ancient Metrology. [1] To be sure, the question had earlier […]
by Rich Pieciak and Kay-Uwe Sander Volume 12:3, Jul-Sep 2005 As a fundamental tool of virtually every microwave and many digital design engineers, the accuracy of a signal generator is critical, whether in the laboratory, […]
by William M. Kilpatrick Volume 11:3, Jul-Sep 2004 When Hewlett-Packard introduced the HP 8902A measuring receiver in 1981, IBM had just announced the personal computer, the World Wide Web was just a glimmer in the […]
by Dave Abell and Jon Moens Volume 9:4, Oct-Dec 2002 Calculating measurement uncertainties for a single parameter such as DC voltage is relatively straightforward, but to do so for a complex microwave spectrum analyzer that […]
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