by Peter B. Crisp Volume 6:5, Sep-Oct 1999 Many organizations rely on 10V DC standards as their primary DC reference. However, the routine maintenance of such devices is not only labor intensive, but requires a […]
by A.J. Wallard and T.J. Quinn Volume 6:6, Nov-Dec 1999 Concern has grown in recent years over the assertion by manufacturers of quantum-based commercial equipment that these products are intrinsic standards. A.J. Wallard, Deputy Director […]
Large capacity rack allows longer walk-way measurement time Dual robotic arm save time by collecting up to four test weights and a reference weight for simultaneous measurement Modular, compact design provides three systems to suit […]
by Hening Huang This paper presents two simple and practical frequentist methods for combining prior information with current measurement in uncertainty analysis. The first method is based on the “law of combination of distributions” (LCD). […]
by Rado Lapuh There is often a need in metrology to use a high precision sampling digital multi-meters in order to look at the amplitude, frequency and phase of a sinewave signal in detail. But […]
Volume 4:6, Nov-Dec 1997 A look at 40 years of innovations, in celebration of Guidline’s birthday. Includes timeline. READ FULL ARTICLE (PDF)
by Mitch Johnson Volume 4:2, Mar-Apr 1997 A digital storage oscilloscope is one of the most versatile pieces of test equipment on the market, offering the capability of automatic parmeter measurements on a variety of […]
by Keith P. Bargroff Volume 3:3, May-Jun 1996 The adoption of quality standards, such as ISO 9000, coupled with the growth in computerized, digital-storage-oscilloscope-based measuring systems has led to a demand for cost-effective, automated, oscilloscope […]
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