February 12, 2020 – NIST News Researchers at the National Institute of Standards and Technology (NIST) have found a way to link measurements made by a device integral to microchip fabrication and other industries directly […]
January 31, 2020 – Ottawa, Ontario – National Research Council of Canada Business leaders, researchers, and students today celebrated the launch of the Joint Centre for Extreme Photonics (JCEP) in Ottawa. Established by the National […]
USB VNA is the next generation of advanced RF test & instrumentation. Performance, form factor, security and lower cost of ownership make these analyzers ideal for many RF and microwave applications. USB VNAs separate the […]
By Hening Huang A variety of statistical methods are available for estimating consensus values in interlaboratory studies (including key comparisons). These methods, although developed based on different approaches and ranging from simple to complex, produce […]
By Dennis Destefan and William Hinton It is well accepted in the metrology community that industry does not have a sustainable source of trained calibration professionals. We explore the availability of metrology-related training and its […]
By Hannah Eilers Where can you find the latest metrology news and information, introductory to NMI-level training, and valuable industry connections? All of this can be achieved at annual trade shows. And believe it or […]
PTB-News 3.2019 24.09.2019 At PTB, a pulse-driven Josephson standard for the generation of AC voltages has been realized where the voltage pulses are synthesized by means of optical components. This has advantages compared to the […]
The Vitrek DL Series offers industry-leading performance in 125W-500W applications; supports best-in-class transient loading capability (from 0.1µW resolution to 14.5kW pulses); features high-speed pulse loading up to 100 kHz; boasts up to ten times better […]
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