Tokyo, Japan – August 28, 2020 Yokogawa Test & Measurement Corporation announces that it has developed the DLM5000 series mixed signal oscilloscopes and will be releasing 350 MHz and 500 MHz models to the market […]
While the measurement of super smooth surfaces typically requires the use of optical metrology tools, it is important to realize that not all optical solutions are the same. The metrology option chosen for such surfaces […]
Engineers at the National Institute of Standards and Technology (NIST) have developed a flexible, portable measurement system to support design and repeatable laboratory testing of fifth-generation (5G) wireless communications devices with unprecedented accuracy across a […]
by Patrick J. Abbott The International Prototype Kilogram (IPK) realized the unit of mass in the International System of Units (SI) for over 130 years. On May 20, 2019, all fundamental quantities of the SI […]
by Brian Walker Calibration methodology for Vector Network Analysis has evolved over the years. The first calibrations were simple normalizations. Later, with a better understanding of the systematic errors a calibration methodology involving the measurements […]
by Christopher L. Grachanen Vector Network Analyzers (VNA) are used to measure a variety of RF parameters such as transmission loss, reflection loss, phase and group delay for a variety of passive RF devices and […]
The simple exterior of the new building for the Measurement Standards Laboratory of New Zealand (MSL) hides a complex design and a technologically advanced laboratory. Based at Callaghan Innovation in Gracefield, Lower Hutt, scientists and […]
Brea, California: The International Accreditation Service (IAS) in Brea, California, will hold a few online World Accreditation Day event, Tuesday, June 9th, from 9:00 am to 10:30 am (Pacific Daylight Time). World Accreditation Day is […]
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