Apr-Jun 2012 issue of Cal Lab Magazine
By Martin L. Kidd This Metrology 101 article addresses the impact of thermoelectric voltage (EMF) on low-voltage measurements. Using a high precision digital multimeter, the author demonstrates how you can inadvertently introduce thermal EMF errors. […]
By Paul Roberts There are many potential sources of human and measurement errors in RF calibration. This paper examines five common error sources associated with connectors, cables, and accessories such as adapters, splitters and couplers: […]
By John Wright, Aaron Johnson, Gina Kline, Chris Crowley, Jodie Pope, Vern Bean, Kevin John, Jeremy Latsko, David Pfeffer, James Winchester, Michael Case, Gary Mahoney, Gary Quigley, Jason Bellavance, Jon Fitzgerald, Bradley Ramsey, Wes England, […]
By Michael Schwartz In many of today’s software projects, developers are challenged with the task of designing interchangeable standards architecture into their metrology based applications. Currently, many developers see an oscilloscope as an oscilloscope and […]
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