Articles Published in Cal Lab Magazine
by Dave Abell and Jon Moens Volume 9:4, Oct-Dec 2002 Calculating measurement uncertainties for a single parameter such as DC voltage is relatively straightforward, but to do so for a complex microwave spectrum analyzer that […]
by Jeff Gust Volume 7:5, Sep-Oct 2000 As metrologists are acutely aware, when one transfers a measured value such as resistance, they also transfer a measurement uncertainty that is associated with the calibration of the […]
by Peter B. Crisp Volume 6:5, Sep-Oct 1999 Many organizations rely on 10V DC standards as their primary DC reference. However, the routine maintenance of such devices is not only labor intensive, but requires a […]
by A.J. Wallard and T.J. Quinn Volume 6:6, Nov-Dec 1999 Concern has grown in recent years over the assertion by manufacturers of quantum-based commercial equipment that these products are intrinsic standards. A.J. Wallard, Deputy Director […]
by Hening Huang This paper presents two simple and practical frequentist methods for combining prior information with current measurement in uncertainty analysis. The first method is based on the “law of combination of distributions” (LCD). […]
by Rado Lapuh There is often a need in metrology to use a high precision sampling digital multi-meters in order to look at the amplitude, frequency and phase of a sinewave signal in detail. But […]
Volume 4:6, Nov-Dec 1997 A look at 40 years of innovations, in celebration of Guidline’s birthday. Includes timeline. READ FULL ARTICLE (PDF)
by Mitch Johnson Volume 4:2, Mar-Apr 1997 A digital storage oscilloscope is one of the most versatile pieces of test equipment on the market, offering the capability of automatic parmeter measurements on a variety of […]
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