by David F. Martson The development and use of intrinsic standards, e.g., Josephson Voltage Standard or JVS, has brought the primary level of uncertainty achievable for DC voltage down to a few nV/V (ppb), while […]
by James G. Salsbury When an accredited laboratory makes a statement of conformity to a specification, ISO/IEC 17025 requires the use of a decision rule that takes into account the level of risk associated with […]
by Dan Wiswell We’ve all heard people speak of accuracies and tolerances in more colorful language than what would be expected in a metrology lab. “Plus-or-minus a hand grenade” or, “Close enough for government work” […]
Over the years, I have had one foot in the metrology/test and measurement world and the other foot in software and software architecture. With two different perspectives, I tend to look at things from multiple […]
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