Scientists from NPL, in collaboration with Instituto Nazionale di Ricerca Metrologica (Italy), Graphenea SA (Spain), Das-Nano (Spain), delivered the EMPIR Grace project with the aim of developing novel metrology for electrical characterisation of graphene, to enable standardisation electrical measurements of future graphene-based electronics.
Graphene has become the focus of extensive research efforts to harness the potential for disruptive applications. Advances in manufacturing mean that the material can now be produced on a wafer scale up to 6’’. To harness the opportunity for the development of next generation graphene-based electronic components using wafer scale materials, electrical characterization of graphene is imperative and requires the measurement of work function, sheet resistance, carrier concentration and mobility on a variety of scales (i.e. macro-, micro- and nano-scale).
